Optical Measurement of Surface Topography Richard Leach Books
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Optical Measurement of Surface Topography Richard Leach Books
Richard Leach has put together a fine collection of chapters written by experts in the field of optical metrology, spanning techniques from chromatic confocal to digital holographic microscopy. A fine editing job assures a cohesive flow from one chapter to the next, making the book suitable for cover-to-cover reading. The ensemble of contributions results in an extensive reference bibliography for further study. A nice introduction to a diverse field, and a handy desk reference.Product details
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Tags : Amazon.com: Optical Measurement of Surface Topography (9783642120138): Richard Leach: Books,Richard Leach,Optical Measurement of Surface Topography,Springer,364212013X,Science : Weights & Measures,Technology & Engineering Microwaves,Technology & Engineering : Material Science
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Optical Measurement of Surface Topography Richard Leach Books Reviews
This collection of technical articles is a very well written, well organized explanation of the wide range of non-contact techniques available for surface metrology measurements. Edited by Richard Leach, a top metrologist at the National Physical Laboratory in the UK, this book begins with an introduction to optical surface measurements that includes clear and concise definitions of the relevant technical terms. Importantly, the book clearly explains both profile and areal techniques, and is aimed towards the new ISO 25178 areal measurement standard. The remainder of the book consists of articles dedicated to each non-contact technique, written by an expert in the field. Equipment covered includes, but is not limited to, confocal microscopy, interferometry, focus variation, and scattering methods. Finally, chapters 3 & 4 address the inherent limitations of optical metrology and address the critical topic of correct calibration of an optical measurement system. This book holds an important place as a reference standard for anyone serious about non-contact surface metrology.
Richard Leach has put together a fine collection of chapters written by experts in the field of optical metrology, spanning techniques from chromatic confocal to digital holographic microscopy. A fine editing job assures a cohesive flow from one chapter to the next, making the book suitable for cover-to-cover reading. The ensemble of contributions results in an extensive reference bibliography for further study. A nice introduction to a diverse field, and a handy desk reference.
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